SPI-HDT-LP200-D D Probe for the Hardness Tester HDT-LP200 (General Use)

• Impact Devices:
  • DC (HDT-LP200-DC)
  • C (HDT-LP200-C)
  • D+15 (HDT-LP200-D15)
  • DL (HDT-LP200-DL)
  • E (HDT-LP200-E)
  • G (HDT-LP200-G)
• Hardness Blocks:
  • D (ISH-BHLD) - For all impact devices.
  • G (ISH-BHLG) - Only for the G impact device (ISH-LP200-G).
• Printer: ISH-LP200-PRINTER
• Mounting Bases: (See details)

Application Depending on the Impact Device:

• DC: Internal walls of small spaces
• C: Small or thin parts, coating
• D: General use
• D+15: Deep grooves
• DL: Narrow grooves or small holes
• E: Hard materials
• G: Casting or forging

Technical Specifications:

• Maximum surface roughness (Ra):
  • DC: 2μm
  • C: 0.4μm
  • D: 2μm
  • D+15: 2μm
  • DL: 2μm
  • E: 2μm
  • G: 7μm
• Minimum work weight:
  • Direct measurement:
    • DC: 1.5kg
    • C: 1.5kg
    • D: 5kg
    • D+15: 2kg
    • DL: 1kg
    • E: 5kg
    • G: 15kg
  • Support on base:
    • DC: 0.05kg
    • C: 0.5kg
    • D: 2kg
    • D+15: 0.1kg
    • DL: 0.05kg
    • E: 0.05kg
    • G: 5kg
  • Connection on plate:
    • DC: 0.05kg
    • C: 0.5kg
    • D: 0.05kg
    • D+15: 0.05kg
    • DL: 0.05kg
    • E: 0.05kg
    • G: 1.5kg
• Minimum work thickness:
  • DC: 3mm
  • C: 1mm
  • D: 3mm
  • D+15: 3mm
  • DL: 3mm
  • E: 3mm
  • G: 10mm