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2102231624 - Δωρεάν μεταφορικά άνω 80€ (με ΦΠΑ) - Τιμές χωρίς ΦΠΑ
2102231624 - Δωρεάν μεταφορικά άνω 80€ (με ΦΠΑ)
Johansson Gauge Blocks
Σετ πλακιδίων καλιμπραρίσματος Insize 4108-3005 σε ξύλινη κασετίνα με μεταλλικά μπλοκ μέτρησης
Τεχνικά χαρακτηριστικά 4108-3005 - Πλακίδια για Καλιμπράρισμα Παχύμετρου
Σετ πλακιδίων καλιμπραρίσματος Insize 4108-3005 σε ξύλινη κασετίνα με μεταλλικά μπλοκ μέτρησης
Τεχνικά χαρακτηριστικά 4108-3005 - Πλακίδια για Καλιμπράρισμα Παχύμετρου

Availability & price

Code Includes for calipers Grade Availability excl. VATincl. VAT Cart
4108-3005 30 - 41.3 - 131.4 - 243.5 - 281.2 0-300 GG 2
€439,00
€544,36
0
  • Meet ISO3650/grade 2
  • Supplied with manufacturer inspection certificate.
  • For calibration certificate according to 17025 request a quote
Datasheet Technical datasheet Inspection Certificate Quality document Catalog Full manufacturer catalog
Insize

Official distributor

Insize

INSIZE was founded in 1995 and is one of the world's leading manufacturers of measuring instruments and metrological equipment. With factories in China and other Asian countries, as well as production units in Germany and Italy for the INSIZE PLUS series, the company offers products that stand out for their accuracy, durability and reliability, while being distinguished by their excellent quality-price ratio.

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Johansson Gauge Blocks

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Johansson Tiles

From our Wiki

Johansson Tiles

The Johansson gauge blocks, also known as gauge blocks, are the global reference for linear measurement in machining. They are blocks made of steel, ceramic, or tungsten with surfaces machined with such precision that the phenomenon of wringing (wringing) between them is achieved to create composite dimensions.

  • Accuracy: Available in grades (Grade 0, 1, 2), with Grade K used as a calibration standard for other instruments.
  • Applications: Used for setting micrometers, checking measuring instruments, and as fixed standards in precision engineering.
  • Features: Distinguished by their excellent dimensional stability and low surface roughness, ensuring micrometer-level ($\mu m$) measurements.
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